CH 8180 - Surface & Thin Film Analysis

Institution:

Clemson University

Subject:

Chemistry

Description:

Fundamental principles underlying the most commonly employed techniques for surface and thin films analysis. Representative techniques include atomic force microscopy, scanning electron microscopy, secondary ion mass spectrometry, Auger electron spectroscopy and Rutherford backscattering.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.clemson.edu

Phone Number:

(864) 656-4636

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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